News

December 15, 2009
Fab in Asia Placed Multiple Orders for Jordan Valley's JVX 6200 XRR Metrology Tool
Migdal Ha'Emek, ISRAEL

May 11, 2009
Samsung selects Jordan Valley's JVX6200 for on-line thin films metrology
Migdal Haemek, Israel,

April 09, 2009
TSMC adopts Jordan Valley JVX 6200 for Cu Layer Metrology
Migdal Ha'Emek, ISRAEL

March 18, 2009
Jordan Valley Semiconductors names Paul Ryan as Corporate VP and UK Site Manager
Migdal Ha'Emek, Israel

November 19, 2008
Deloitte Includes Jordan Valley Semiconductors to List of Fastest-Growing Israeli Technology Company
Migdal Ha'Emek, Israel

April 15, 2008
Jordan Valley Acquires Bede Metrology
Migdal Ha’Emek

December 11, 2007
New JV System Lowers Cost of Ownership, Improves Throughput Utilization
Migdal Ha’Emek, Israel

October 29, 2007
Jordan Valley Named to List of Fastest-Growing Israeli Companies
Migdal Ha’Emek, Israel, October 29, 2007

October 16, 2007
Intel Capital Invests $11 Million in Jordan Valley

May 01, 2007
Wafer-Level Packaging Requirements Boost Orders for Jordan Valley Systems
Migdal Ha' Emek, Israel, May 01, 2007

December 01, 2006
Jordan Valley Semiconductors Lands Multiple Unit Order
Migdal Ha’Emek, Israel, December 1, 2006

October 04, 2006
Jordan Valley, OpenDream Penetrate Korean Semiconductor Market

July 26, 2006
Jordan Valley Awarded ISO 9001:2000 Certification

June 08, 2006
Jordan Valley Secures Multi-Million Dollar Order

April 06, 2006
Jordan Valley to Introduce a Fast Wide Angle Micro-XRD Metrology Tool

December 01, 2005
Jordan Valley Unveils Next-Generation Thin-Film Metrology Platform

July 18, 2005
Jordan Valley Earns Editors' Choice Best Product Award