The 2012 "Best of West" award was presented to Jordan Valley Semiconductor UK Ltd. for their QC-TT defect inspection system at a ceremony on Wednesday, July 11, 2012 at the annual SEMICON West exhibition.

At a presentation ceremony in the Jordan Valley Semiconductor booth, Isaac Mazor, CEO of Jordan Valley Semiconductor, said, "One thing I'm really proud of is that it [the system] was developed in the U.K. It's hitting significant needs for 300-millimeter and 450-millimeter [wafers]." Alon Kapel, the company's director of sales and marketing, noted this is the second time in three years that Jordan Valley Semiconductor has won the "Best of West" award. He looks forward to claiming the prize again in 2013.

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