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High-K Metal Gate with JVX7300HR
Written by Asaf Shlomo
26771
Defect Imaging (XRDI)
Written by Graeme Gibson
59131
Silicides
Written by Graeme Gibson
29282
Strain Metrology
Written by Graeme Gibson
34504
Quick Links
Wafer Level Packaging
UBM, RDL and Micro Bumps
High-Resolution XRD for LED and Thin-Films Process Control
Semiconductors FEOL
Strain Metrology
HKMG with JVX7300HR
Silicides
Defect Imaging
Semiconductor BEOL
Cu Seed Barrier
Cu Microstructure
Cu CMP Control
Compound Semiconductors
HRXRD
Relaxation and Strain
Triple Axis and RSM
Defect Imaging
Other Applications
General XRR
Polycrystalline XRD
MRAM, GMR and HDD
