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Jordan Valley's Delta-X is the latest generation of flexible X-ray diffraction instruments for thin-film materials resea...

The JVX6200 Series Production-line proven X-ray metrology platform for FEOL, BEOL and WLP The JVX 6200 multichannel pla...

X-Ray Diffraction Imaging (XRDI) reflection inspection system that detects crystalline defects in patterned and blanket ...

New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™,...

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structu...

The JVX6200iF Galaxy Production-line proven X-ray metrology platform for μ-bump Sn/Ag composition. Micro spot XR...

The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting...

QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass product...

Please visit us at Semicon West 2013 at booth 1613 at the Moscone Centre, San Francisco, CA on July 9 - 11

Semicon West 2013