Featured Products

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JVSensus

JVSensus

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

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JVX7200

JVX7200

New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™,...

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JVX7300LMI

JVX7300LMI

Scanning HRXRD, XRR, WA-XRD for sub 20nm Si logic R&D, process development and production process monitoring on blan...

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JVX6200 series

JVX6200 series

The JVX6200 Series Production-line proven X-ray metrology platform for FEOL, BEOL and WLP The JVX 6200 multichannel pla...

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JVX6200iF Galaxy

JVX6200iF Galaxy

  The JVX6200iF Galaxy Production-line proven X-ray metrology platform for μ-bump Sn/Ag composition. Micro spot XR...

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JVX6200iRF

JVX6200iRF

JVX6200iRF  In-line X-ray metrology platform for FEOL, MEOL & BEOL for the semiconductors industry JVX6200iRF&...

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QC3

QC3

QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass product...

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RADS Software

RADS Software

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structu...

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QC-TT

QC-TT

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

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QC-Velox

QC-Velox

The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting...

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QC-RT

QC-RT

X-Ray Diffraction Imaging (XRDI) reflection inspection system that detects crystalline defects in patterned and blanket ...

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Delta-X

Delta-X

Jordan Valley's Delta-X is the latest generation of flexible X-ray diffraction instruments for thin-film materials resea...

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Visit us at SemiconWest 2014
Visit us at Semicon West 2014
8th to 10th July, Moscone Center, San Francisco

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Cell: +1-512-7407944