Jordan Valley QC-TT Announced as Finalist in Semi Best of West 2012

29th June 2012

Solid State Technology and SEMI today announced the QC-TT as one of the finalists for the 2012 "Best of West" awards, recognizing important product and technology developments in the microelectronics supply chain. Held in conjunction with SEMICON West, the largest and most influential microelectronics exposition in North America, the Best of West finalists have been selected based on their financial impact on the industry, engineering or scientific achievement, and/or societal impact.

The QC-TT defect inspection system from Jordan Valley Semiconductor UK Ltd solves key issues in the use of 450mm wafers in a manufacturing environment, where wafers are subjected to more handling steps and the thermal stresses on larger wafers are much higher. This makes the wafers more prone to breakage, which can be predicted using the QC-TT. The system can also identify the slip and other crystalline defects in wafers, which may not have catastrophic effects on the substrate integrity but will contribute to a reduction in yield.

You can see the other finalists here.