MIGDAL HAEMEK, Israel, June 8, 2015

Jordan Valley, the dominant supplier of X-ray based in-line metrology systems for the semiconductor and related industries, today announced it received a repeat order from a leading HDD manufacturer who selected the new JVX7300RF metrology system for their advanced process control.

The JVX7300RF system provides high-value in-line metrology capabilities and combines Jordan Valley's unique convergentbeam XRR and the vertical small spot XRF measurement channels on their latest generation tool platform. The tool provides product wafers metrology solutions for complex multilayer stacks, ultra-thin layers (<10Å) and small pads.

The JVX7300RF provides excellent ROI and CoO for inline metrology of magnetic stacks used in latest generation of read-heads and allows non-destructive thickness and composition measurements at high throughputs prior to head assembly.

The customer noted that the JVX7300RF was ordered after successful evaluation of the combined XRR/XRF technology in multiple production sites last year.

Isaac Mazor, Jordan Valley's CEO commented: "This tool was selected due to its substantial return of investment. Hard disk manufacturers set unique metrology challenges and requirements for advanced process control. The JVX7300RF is the successor of the production proven JVX6200iRF and provides significantly improved productivity, new capabilities, improved ease-of-use, maintainability and more."

About the JVX7300RF production metrology tool

The JVX7300RF is a production worthy X-ray metrology tool combining XRR and XRF channels. The tool targets both semiconductor 20nm and below FEOL applications and advanced HDD manufacturing. The tool is configured for full fab automation and is SEMI S2/S8 and CE certified.

Jordan Valley's management will attend Semicon West in San Francisco on July 14-16, 2015. To schedule a meeting, please contact This email address is being protected from spambots. You need JavaScript enabled to view it.

About Jordan Valley Semiconductors Ltd.

Jordan Valley Semiconductors (JVS) is the leader in X-ray metrology and defect detection tools for the semiconductor industries. Jordan Valley's tools are fully automated non-contacting and non-destructive tools designed for production control on patterned or blanket wafers.

The company offers the semiconductor industry the most comprehensive portfolio of advanced metrology and defect inspection tools, based on X-ray technologies such as XRR (X-ray reflectometry), XRF (X-ray fluorescence), XRD (X-ray diffraction) and others.

Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE: CII), Intel Capital (NASDAQ: INTC) and Elron Electronics Industries Ltd. (TASE: ELRN). With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK, Austin TX, USA, Hsin-Chu Taiwan, Suwon Korea and other offices and sales representatives worldwide.

For more information:
Gali Ashkenazi
Tel: +972-4654-3666
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