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JVX7200 X-ray Metrology Tool New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™, provides manufacturers with p... Read more |
JVX 6200/JVX6200i The JVX6200 & JVX6200i: Production-line proven X-ray metrology platform for FEOL and BEOLThe JVX 6200 multichannel platform offers significant thin fi... Read more |
QC3 QC3是在原Bede公司質量控制型(QC)高解析度X射線繞射儀的基礎上發展設計的最新機型。QC系列產品的歷史已經超過了20年，並在全球擁有數百家使用該設備对化合物半導體和SiGe材料进行科学研究和生產監控的客戶群體。QC3是專為半導體生產研發和質量監控而設計的高解析度X射線繞射儀，可以用於各種類型磊... Read more |
Jordan Valley RADS SoftwareRADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structures on single crystal substrates. ... Read more |
Latest News
- Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
- Updated Publications Section
- Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
- New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
- Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors