JVX7200

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JVX7200 X-ray Metrology Tool

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New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™, provides manufacturers with p...

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JVX 6200/JVX6200i

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The JVX6200 & JVX6200i: Production-line proven X-ray metrology platform for FEOL and BEOLThe JVX 6200 multichannel platform offers significant thin fi...

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QC3

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QC3是在原Bede公司质量控制型(QC)高分辨率X射线衍射仪的基础上发展设计的最新机型。QC系列产品的历史已经超过了20年，并在全球拥有数百家使用该设备进行化合物半导体和SiGe材料研究和生产监控的客户群体。QC3是专为半导体生产研发和质量监控而设计的高分辨率X射线衍射仪，可以用于各种类型外延材料...

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Jordan Valley RADS Software

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structures on single crystal substrates. ...

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QC-Velox

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The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting LED, CPV and Epi-Layers wafer...

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