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JVX7200 X-ray Metrology Tool New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™, provides manufacturers with p... Read more |
JVX 6200/JVX6200i The JVX6200 & JVX6200i: Production-line proven X-ray metrology platform for FEOL and BEOLThe JVX 6200 multichannel platform offers significant thin fi... Read more |
QC3 QCシリーズの最新モデルQC3は、長い歴史の中でその実力が証明された高分解能Ｘ線回折計です。20年来、世界各国の化合物半導体やシリコンゲルマニウムの研究と生産設備に数百台の設置実績があります。QC3は、半導体の開発や品質管理に適した高分解能Ｘ線回折ツールで、さまざまな材料のエピタキシャル層で組成と厚... Read more |
Jordan Valley RADS SoftwareRADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structures on single crystal substrates. ... Read more |
Latest News
- Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
- Updated Publications Section
- Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
- New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
- Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors