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Jordan Valley Semiconductors Ltd.
  • Products
    Semiconductors
    • JVX 7200
    • JVX 6200 Family
    • BedeMetrix™-F
    • BedeScan™
    Compound Semi, General Thin Film
    • JV QC3 - Production
    • JV D1: R&D
  • Applications
    Semiconductors FEOL
    • Strain Metrology
    • High-K & Metal Gate
    • Silicides
    • Defect Imaging
    Semiconductors BEOL
    • Cu Seed Barrier
    • Cu Microstructure
    • Cu CMP control
    Wafer Level Packaging
    • UBM, RDL & Bumps
    Compound semiconductors
    • HRXRD
    • Relaxation & Strain
    • Triple Axis & RSMs
    • Defect Imaging
    Other Applications
    • General XRR
    • Polycrystalline XRD
    • MRAM, GMR & HDD
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