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Semiconductors
JVX 7200
JVX 6200 Family
BedeMetrix™-F
BedeScan™
Compound Semi, General Thin Film
JV QC3 - Production
JV D1: R&D
Semiconductors FEOL
Strain Metrology
High-K & Metal Gate
Silicides
Defect Imaging
Semiconductors BEOL
Cu Seed Barrier
Cu Microstructure
Cu CMP control
Wafer Level Packaging
UBM, RDL & Bumps
Compound semiconductors
HRXRD
Relaxation & Strain
Triple Axis & RSMs
Defect Imaging
Other Applications
General XRR
Polycrystalline XRD
MRAM, GMR & HDD
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Downloads
Application Notes
Analysis of GaAs pHEMT using HRXRD (D1 / QC3)
jv gaas phemt structure analysis.pdf
(638.33 kB)
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Defect determination of GaAs substrate using Reciprocal Space Mapping (D1 / QC3)
jv gaas substrate defect analysis using rsm.pdf
(529.84 kB)
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GaN MQW characterization using triple axis HRXRD (D1 / QC3)
jv gan mqw structure determination.pdf
(477.36 kB)
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