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In-Line Characterization of SiGe HBTs
2008 istdm imec - in-line characterization of sige hbts poster.pdf (559.81 kB)
 
Asymmetric Relaxation of SiGe in Patterned Si Line Structures
2007 frontiers of nanoelectronics - asymmetric relaxation of sige in patterned si line structures poster.pdf (1.46 MB)
 
Ultra Low-κ Metrology Using X-Ray Reflectivity And Small-Angle X-Ray Scattering Techniques
2007 nist_l plantier_lowk_poster.pdf (384.42 kB)
 
Characterization of Surface Preparation for Epitaxial SiGeProcess using X-ray Reflectivity [XRR]
2006 ecs sige cjlee umc poster.pdf (168.39 kB)
 
High-Resolution Small Spot X-Ray Fluorescence Study of Copper Processing in Back-End-Of-Line
2006 mam spring poster jpg imec poster.pdf (328.60 kB)
 
X-ray Metrology for High-K Atomic Layer Deposited HfxZr1-xO2 Films
2006 adv. gate stack symp x-ray metrology for high-k hfxzr1-xo2_freescale poster.pdf (279.27 kB)
 
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