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Semiconductors
JVX 7200
JVX 6200 Family
BedeMetrix™-F
BedeScan™
Compound Semi, General Thin Film
JV QC3 - Production
JV D1: R&D
Semiconductors FEOL
Strain Metrology
High-K & Metal Gate
Silicides
Defect Imaging
Semiconductors BEOL
Cu Seed Barrier
Cu Microstructure
Cu CMP control
Wafer Level Packaging
UBM, RDL & Bumps
Compound semiconductors
HRXRD
Relaxation & Strain
Triple Axis & RSMs
Defect Imaging
Other Applications
General XRR
Polycrystalline XRD
MRAM, GMR & HDD
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Downloads
Instrument Brochures
6200i Product Brochure
jvx6200i.pdf
(3.25 MB)
Download
D1 Evolution Tool Brochure
jv d1 evolution full tool flyer.pdf
(1.62 MB)
Download
QC3 Tool Brochure
jv qc3 full tool flyer.pdf
(897.54 kB)
Download
QC3 Tool Brochure CHINESE
qc3toolbrochurechinese.pdf
(881.11 kB)
Download
QC3 Tool Brochure KOREAN
qc3 full tool flyer korean.pdf
(1.78 MB)
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