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1 JVX 7200 awarded the Best of West at SEMICON West 2010 July 19, 2010
2 Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm July 15, 2010
3 Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200 June 25, 2010
4 Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control April 28, 2010
5 X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol March 23, 2010
6 Jordan Valley Semiconductors Announces 2009 Year-end Performance March 18, 2010
7 Jordan Valley Semiconductors Targets Quality Control in LED and Compound Semiconductor Manufacturing - Feb 2010 February 02, 2010
8 TSMC adopts Jordan Valley JVX 6200 for Cu Layer Metrology - Apr 2009 June 03, 2009
9 Samsung selects Jordan Valley's JVX6200 for on-line thin films metrology - May 2009 March 11, 2009
10 Jordan Valley Semiconductors names Paul Ryan as Corporate VP and UK Site Manager - Mar 2009 March 11, 2009
 
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