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Semiconductors
JVX 7200
JVX 6200 Family
BedeMetrix™-F
BedeScan™
Compound Semi, General Thin Film
JV QC3 - Production
JV D1: R&D
Semiconductors FEOL
Strain Metrology
High-K & Metal Gate
Silicides
Defect Imaging
Semiconductors BEOL
Cu Seed Barrier
Cu Microstructure
Cu CMP control
Wafer Level Packaging
UBM, RDL & Bumps
Compound semiconductors
HRXRD
Relaxation & Strain
Triple Axis & RSMs
Defect Imaging
Other Applications
General XRR
Polycrystalline XRD
MRAM, GMR & HDD
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Jordan Valley Company
Latest News
JVX 7200 awarded the Best of West at SEMICON West 2010
Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol
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