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Jordan Valley Semiconductors Ltd.
  • Products
    Semiconductors
    • JVX 7200
    • JVX 6200 Family
    • BedeMetrix™-F
    • BedeScan™
    Compound Semi, General Thin Film
    • JV QC3 - Production
    • JV D1: R&D
  • Applications
    Semiconductors FEOL
    • Strain Metrology
    • High-K & Metal Gate
    • Silicides
    • Defect Imaging
    Semiconductors BEOL
    • Cu Seed Barrier
    • Cu Microstructure
    • Cu CMP control
    Wafer Level Packaging
    • UBM, RDL & Bumps
    Compound semiconductors
    • HRXRD
    • Relaxation & Strain
    • Triple Axis & RSMs
    • Defect Imaging
    Other Applications
    • General XRR
    • Polycrystalline XRD
    • MRAM, GMR & HDD
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Home Jordan Valley Company

Latest News

  • JVX 7200 awarded the Best of West at SEMICON West 2010
  • Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
  • Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
  • Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
  • X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol
News & Events
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