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Si Semiconductors Metrology
JVX 7200
JVX 6200 Family
VUV700U
BedeMetrix™-F
BedeScan™
Compound Semi X-ray Metrology
QC-Velox: Advanced Production
QC3: Mainstream Production
D1: R&D
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RADS Software
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Cu Seed Barrier
Cu Microstructure
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UBM, RDL & Bumps
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1
Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
十月 04, 2011
2
Updated Publications Section
六月 24, 2011
3
Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
六月 22, 2011
4
New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
一月 11, 2011
5
Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors
十一月 16, 2010
6
JVX 7200 awarded the Best of West at SEMICON West 2010
七月 19, 2010
7
Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
七月 15, 2010
8
NEW ARTICLE including VIDEO: "Production metrology of advanced LED structures using high-resolution X-ray diffraction" published in Solid State Technology
七月 01, 2010
9
Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
六月 25, 2010
10
Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
四月 28, 2010
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