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Jordan Valley Semiconductors Ltd.
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  • Products
    Si Semiconductors Metrology
    • JVX 7200
    • JVX 6200 Family
    • VUV700U
    • BedeMetrix™-F
    • BedeScan™
    Compound Semi X-ray Metrology
    • QC-Velox: Advanced Production
    • QC3: Mainstream Production
    • D1: R&D
    • QC-RT: FA & R&D
    • RADS Software
  • Applications
    Semiconductors FEOL
    • Strain Metrology
    • High-K & Metal Gate
    • Silicides
    • Defect Imaging
    Semiconductors BEOL
    • Cu Seed Barrier
    • Cu Microstructure
    • Cu CMP control
    Wafer Level Packaging
    • UBM, RDL & Bumps
    Compound semiconductors
    • HRXRD
    • Relaxation & Strain
    • Triple Axis & RSMs
    • Defect Imaging
    Other Applications
    • General XRR
    • Polycrystalline XRD
    • MRAM, GMR & HDD
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Latest News

  • Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
  • Updated Publications Section
  • Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
  • New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
  • Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors
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