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Si Semiconductors Metrology
JVX 7200
JVX 6200 Family
VUV700U
BedeMetrix™-F
BedeScan™
Compound Semi X-ray Metrology
QC-Velox: Advanced Production
QC3: Mainstream Production
D1: R&D
QC-RT: FA & R&D
RADS Software
Semiconductors FEOL
Strain Metrology
High-K & Metal Gate
Silicides
Defect Imaging
Semiconductors BEOL
Cu Seed Barrier
Cu Microstructure
Cu CMP control
Wafer Level Packaging
UBM, RDL & Bumps
Compound semiconductors
HRXRD
Relaxation & Strain
Triple Axis & RSMs
Defect Imaging
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Application Notes
Analysis of GaAs pHEMT using HRXRD (D1 / QC3)
jv gaas phemt structure analysis.pdf
(638.33 kB)
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Defect determination of GaAs substrate using Reciprocal Space Mapping (D1 / QC3)
jv gaas substrate defect analysis using rsm.pdf
(529.84 kB)
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GaN MQW characterization using triple axis HRXRD (D1 / QC3)
jv gan mqw structure determination.pdf
(477.36 kB)
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JV D1 Topo Apps Note
jv d1 topo apps note.pdf
(599.54 kB)
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