Quality

Jordan Valley Semiconductors Ltd are ISO accredited in both UK and Israel offices and have comprehensive Quality, Environmental and Safety Policies in place to help protect both our Customers, Investors and our employees.

Our main policies are available to view below.

Quality Policy UK - ISO 9001:2008
Quality Policy IL - ISO 9001:2008
Environmental/Safety Policy IL

Featured Products

1
2
3

Prev Next

Delta-X

Delta-X

Jordan Valley's Delta-X is the latest generation of flexible X-ray diffraction instruments for thin-film materials resea...

JVX6200 series

JVX6200 series

The JVX6200 Series Production-line proven X-ray metrology platform for FEOL, BEOL and WLP The JVX 6200 multichannel pla...

QC-RT

QC-RT

X-Ray Diffraction Imaging (XRDI) reflection inspection system that detects crystalline defects in patterned and blanket ...

JVX7200

JVX7200

New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™,...

QC-TT

QC-TT

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

RADS Software

RADS Software

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structu...

JVX6200iF Galaxy

JVX6200iF Galaxy

The JVX6200iF Galaxy Production-line proven X-ray metrology platform for μ-bump Sn/Ag composition. Micro spot XR...

QC-Velox

QC-Velox

The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting...

QC3

QC3

QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass product...

JVX6200iRF

Upcoming Events

Please visit us at Semicon West 2013 at booth 1613 at the Moscone Centre, San Francisco, CA on July 9 - 11

Semicon West 2013