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Si Semiconductors Metrology
JVX 7200
JVX 6200 Family
VUV700U
BedeMetrix™-F
BedeScan™
Compound Semi X-ray Metrology
QC-Velox: Advanced Production
QC3: Mainstream Production
D1: R&D
QC-RT: FA & R&D
RADS Software
Semiconductors FEOL
Strain Metrology
High-K & Metal Gate
Silicides
Defect Imaging
Semiconductors BEOL
Cu Seed Barrier
Cu Microstructure
Cu CMP control
Wafer Level Packaging
UBM, RDL & Bumps
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Jordan Valley Company
Press Releases
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Article Title
Date
1
Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
October 04, 2011
2
Updated Publications Section
June 24, 2011
3
Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
June 22, 2011
4
New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
January 11, 2011
5
Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors
November 16, 2010
6
JVX 7200 awarded the Best of West at SEMICON West 2010
July 19, 2010
7
Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
July 15, 2010
8
NEW ARTICLE including VIDEO: "Production metrology of advanced LED structures using high-resolution X-ray diffraction" published in Solid State Technology
July 01, 2010
9
Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
June 25, 2010
10
Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
April 28, 2010
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