Updated Publications Section

Two new scientific papars from Jordan Valley Semiconductor employees have been published recently.  They are linked in the table below.  A full list of papers is shown on our publications page.

 The two papers are below:

2011 Metrology of epitaxial thin-films by advanced HRXRD and XRR Electro IQ
2011
A Novel X-ray Diffraction and Reflectivity Tool for Front-End of Line Metrology
FCMN2011