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Si Semiconductors Metrology
JVX 7200
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아이템 제목
날짜
1
Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
10월 04, 2011
2
Updated Publications Section
JUNE 24, 2011
3
Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
JUNE 22, 2011
4
New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
1월 11, 2011
5
Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors
11월 16, 2010
6
JVX 7200 awarded the Best of West at SEMICON West 2010
7월 19, 2010
7
Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
7월 15, 2010
8
NEW ARTICLE including VIDEO: "Production metrology of advanced LED structures using high-resolution X-ray diffraction" published in Solid State Technology
7월 01, 2010
9
Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
JUNE 25, 2010
10
Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
4월 28, 2010
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