Technical Support

Our technical support team comprises of warranty, repairs, periodic maintenance and support as well as spare part catalogues to give maximum up-time for our customers.  For more information please contact your nearest representative or use our online contact form.

US Customers please call our 24/7 US Customer service Hotline: +1 (866) 515-5200

Application Support

We have an impressive team of application engineers and scientists to help solve application problems.  For more information please contact your nearest representative or use our online contact form and we will contact you back as soon as we can.

Training

We offer a range of training courses for our products to help you obtain the most effecient and accurate results.  For more information please contactyour nearest representative or use our online contact form and we will contact you back as soon as we can.

Featured Products

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JVSensus

JVSensus

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

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JVX7200

JVX7200

New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™,...

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JVX7300LMI

JVX7300LMI

Scanning HRXRD, XRR, WA-XRD for sub 20nm Si logic R&D, process development and production process monitoring on blan...

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JVX6200 series

JVX6200 series

The JVX6200 Series Production-line proven X-ray metrology platform for FEOL, BEOL and WLP The JVX 6200 multichannel pla...

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JVX6200iF Galaxy

JVX6200iF Galaxy

  The JVX6200iF Galaxy Production-line proven X-ray metrology platform for μ-bump Sn/Ag composition. Micro spot XR...

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JVX6200iRF

JVX6200iRF

JVX6200iRF  In-line X-ray metrology platform for FEOL, MEOL & BEOL for the semiconductors industry JVX6200iRF&...

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QC3

QC3

QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass product...

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RADS Software

RADS Software

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structu...

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QC-TT

QC-TT

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

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QC-Velox

QC-Velox

The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting...

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QC-RT

QC-RT

X-Ray Diffraction Imaging (XRDI) reflection inspection system that detects crystalline defects in patterned and blanket ...

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Delta-X

Delta-X

Jordan Valley's Delta-X is the latest generation of flexible X-ray diffraction instruments for thin-film materials resea...

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