Press Releases
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# 記事タイトル 日時
1 Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50 10月 04, 2011
2 Updated Publications Section 6月 24, 2011
3 Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry 6月 22, 2011
4 New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool 1月 11, 2011
5 Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors 11月 16, 2010
6 JVX 7200 awarded the Best of West at SEMICON West 2010 7月 19, 2010
7 Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm 7月 15, 2010
8 NEW ARTICLE including VIDEO: "Production metrology of advanced LED structures using high-resolution X-ray diffraction" published in Solid State Technology 7月 01, 2010
9 Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200 6月 25, 2010
10 Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control 4月 28, 2010
 
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