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2006 MRS Advanced XRF And Innovative Interconnect and Process Metrology Solution for 45 nm and Beyond
2006 mrs spring 2006 jpg imec presentation.pdf (1.45 MB)
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2007 Altech (IMEC) Characterization of HBT Base Layers by HRXRD
2007 altech imec - characterization of hbt base layers presentation.pdf (1.05 MB)
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2008 EMC In-plane HRXRD from sSOI
2008 emc -in-plane hrxrd from ssoi extended presentation.pdf (1.04 MB)
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2012 Semicon Korea
2012_semicon_korea_v5_public.pdf (1.67 MB)
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