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- Press Releases
- JVX 7200 awarded the Best of West at SEMICON West 2010
- Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
- Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
- Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
- X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol
- Jordan Valley Semiconductors Announces 2009 Year-end Performance
- Jordan Valley Semiconductors Targets Quality Control in LED and Compound Semiconductor Manufacturing - Feb 2010
- TSMC adopts Jordan Valley JVX 6200 for Cu Layer Metrology - Apr 2009
- Samsung selects Jordan Valley's JVX6200 for on-line thin films metrology - May 2009
- Jordan Valley Semiconductors names Paul Ryan as Corporate VP and UK Site Manager - Mar 2009
- Deloitte Includes Jordan Valley Semiconductors to List of Fastest-Growing Israeli Technology Company - Nov 2009
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