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QC3 QC3是在原Bede公司質量控制型(QC)高解析度X射線繞射儀的基礎上發展設計的最新機型。QC系列產品的歷史已經超過了20年，並在全球擁有數百家使用該設備对化合物半導體和SiGe材料进行科学研究和生產監控的客戶群體。QC3是專為半導體生產研發和質量監控而設計的高解析度X射線繞射儀，可以用於各種類型磊... Read more |
JVX 6200/JVX6200i The JVX6200 & JVX6200i: Production-line proven X-ray metrology platform for FEOL and BEOLThe JVX 6200 multichannel platform offers significant thin fi... Read more |
JVX7200 X-ray Metrol New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™, provides manufacturers with p... Read more |
Latest News
- JVX 7200 awarded the Best of West at SEMICON West 2010
- Jordan Valley Semiconductors Announces a New Metrology tool for SiGe, Si:C and Strained Silicon : The JVX7200™ HR. The JVX7200 Platform Offers the First HRXRD Tool to Meet ITRS Production Throughput for 45nm & 22nm
- Jordan Valley Semiconductors Ltd. Receives $10M in Capacity Repeat Order for its JVX6200
- Major Taiwanese LED Manufacturer Places an Order for the new QC3(TM) Diffractometer from Jordan Valley for LED Process Control
- X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol