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JVX7200 X-ray Metrology Tool New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™, provides manufacturers with p... Read more |
JVX 6200/JVX6200i The JVX6200 & JVX6200i: Production-line proven X-ray metrology platform for FEOL and BEOLThe JVX 6200 multichannel platform offers significant thin fi... Read more |
QC3 QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass production operation. Highest throug... Read more |
Jordan Valley RADS Software RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structures on single crystal substrates. ... Read more |
Latest News
- Jordan Valley named among 2011 50 fastest growing companies in Israel by Deloitte Technology Fast 50
- Updated Publications Section
- Jordan Valley Delivers a Multiple System Repeat Order for its Thin Films Metrology Systems From a Major Foundry
- New order from Invenlux Optoelectronics (China) for Jordan Valley QC3™ HRXRD tool
- Jordan Valley Appoints Ken Levy as the New Chairman of the Board of Directors
