Jordan Valley Semiconductors Ltd.

The world leader in X-ray metrology.

Jordan Valley Semiconductors Ltd. provides metrology solutions for thin films based on novel, rapid, non-contacting and non-destructive X-ray technology for the Semiconductors industry.

Seventy five percent of the world's top 25 semiconductor manufacturers rely on Jordan Valley metrology tools for front-end and back-end applications, including development of the next-generations thin films. Jordan Valley's commitment to innovation and technology leadership drives the continuing release of new advances in metrology, and has garnered numerous awards and industry recognition. However, technology alone has not driven the company's success. The Jordan Valley name is synonymous with unparalleled customer service and support.

In April 2008, Jordan Valley extended its technology leadership with the acquisition of Bede, the premiere supplier of high-resolution XRD metrology solutions for the semiconductor and compound industries. The acquisition provides customers worldwide with the industry's most comprehensive suite of X-ray metrology tools, as well as expanded service and support facilities around the globe.

For 30 years, the Jordan Valley team has been at the very forefront of technological superiority and innovation, and consists of more than 100 scientists, engineers, marketing, and support personnel around the globe—including a management and R&D team with decades of experience in semiconductor manufacturing technologies. Research, development, manufacturing, marketing, applications, and customer support are headquartered in Migdal Ha´Emek, Israel. Additional manufacturing and R&D of the QC/D1 & systems are located in Durham, UK. Demo lab is located in Austin Tx, USA. Other Sales & Customer support offices are located in Asia and Europe.

Featured Products

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Delta-X

Delta-X

Jordan Valley's Delta-X is the latest generation of flexible X-ray diffraction instruments for thin-film materials resea...

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JVX6200 series

JVX6200 series

The JVX6200 Series Production-line proven X-ray metrology platform for FEOL, BEOL and WLP The JVX 6200 multichannel pla...

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QC-RT

QC-RT

X-Ray Diffraction Imaging (XRDI) reflection inspection system that detects crystalline defects in patterned and blanket ...

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JVX7200

JVX7200

New X-ray metrology for advanced front-end processes The latest multichannel platform from Jordan Valley, the JVX7200™,...

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QC-TT

QC-TT

X-Ray Diffraction Imaging (XRDI) inspection system that detects crystalline defects in patterned and blanket wafers I...

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RADS Software

RADS Software

RADS software (patented) is the leading simulation, analysis & fit software for HRXRD of epitaxial thin-film structu...

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JVX6200iF Galaxy

JVX6200iF Galaxy

  The JVX6200iF Galaxy Production-line proven X-ray metrology platform for μ-bump Sn/Ag composition. Micro spot XR...

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QC-Velox

QC-Velox

The Jordan Valley QC-Velox is a next-generation High Resolution XRD (HRXRD) system for epilayers (thin films), targeting...

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QC3

QC3

QC3 is a High Resolution XRD (HRXRD) system for epilayers (thin films). It is designed for high-throughput, mass product...

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Upcoming Events

Please visit us at Semicon West 2013 at booth 1613 at the Moscone Centre, San Francisco, CA on July 9 - 11

Semicon West 2013